Joshua T. Vogelstein, Jayanta Dey, Hayden S. Helm, Will LeVine, Ronak D. Mehta, Tyler M. Tomita, Haoyin Xu, Ali Geisa, Qingyang Wang, Gido M. van de Ven, Chenyu Gao, Weiwei Yang, Bryan Tower, Jonathan Larson, Chris White, Carey E. Priebe
IEEE Transactions on Pattern Analysis and Machine Intelligence |
November 2025, 第 47 卷(11): pp. 10033-10046